NDLI: Statistical Test Development for Analog Circuits Under High Process Variations

Content Provider	IEEE Xplore Digital Library
Author	Fang Liu Ozev, S.
Copyright Year	1982
Abstract	The test development efforts for analog circuits today are disproportionately high due to the lack of widely accepted automation methods. The evaluation of a particular test input and measurement setup requires the determination of the probabilistic detection of all faults in the circuit. This evaluation step is the most time consuming step during analog test development. Based on the observation that test evaluation requires injecting many parametric and catastrophic faults into the circuit and analyzing the masking effect of process variations, we develop a fault injection and simulation technique for analog circuits that is specifically geared toward information reuse. We also present a heuristic test selection methodology that aims at providing the same coverage level as the full specification measurements while reducing the test time as well as reliance on hard-to-measure parameters. Experimental results on several circuits confirm the high accuracy of our variance analysis technique and show a nearly 72% reduction in the number of tests for a three-stage amplifier circuit in the experiment after the application of the test selection algorithm.
Sponsorship	IEEE Council on Electronic Design Automation IEEE Circuits and Systems Society
Starting Page	1465
Ending Page	1477
Page Count	13
File Size	484335
File Format	PDF
ISSN	02780070
Volume Number	26
Issue Number	8
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-08-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Analog circuits Circuit faults Automatic testing Automation Particle measurements Electrical fault detection Fault detection Circuit analysis Information analysis test time reduction Analog test process variability
Content Type	Text
Resource Type	Article
Subject	Computer Graphics and Computer-Aided Design Electrical and Electronic Engineering Software

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