NDLI: On the characterization and efficient computation of hard-to-detect bridging faults

Content Provider	IEEE Xplore Digital Library
Author	Pomeranz, I. Reddy, S.M. Kundu, S.
Copyright Year	1982
Abstract	We investigate a characterization of hard-to-detect bridging faults. For circuits with large numbers of lines (or nodes), this characterization can be used to select target faults for test generation efficiently, when it is impractical to target all the bridging faults (or all the realistic bridging faults). We demonstrate that the faults selected based on the proposed characterization are indeed hard-to-detect by performing the following experiments. 1) We show that the fault coverage of a given test set, with respect to the selected subset of bridging faults, is lower and more sensitive to the test set than the fault coverage obtained with respect to a random subset of bridging faults of the same size, with respect to the complete set of bridging faults, and when possible, with respect to a subset of realistic bridging faults of the same size. 2) We demonstrate that a test set generated for the selected subset of bridging faults detects other bridging faults more effectively than when a test set is derived for a randomly selected subset of bridging faults of the same size. We also describe an efficient procedure for selecting hard-to-detect bridging faults according to the proposed characterization. This procedure avoids enumeration of all the faults in order to select the hard-to-detect ones. This is important for large circuits where even enumeration of all the bridging faults may not be feasible.
Sponsorship	IEEE Council on Electronic Design Automation IEEE Circuits and Systems Society
Starting Page	1640
Ending Page	1649
Page Count	10
File Size	630937
File Format	PDF
ISSN	02780070
Volume Number	23
Issue Number	12
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-12-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit faults Circuit testing Fault detection Character generation Performance evaluation Circuit simulation Fault diagnosis Bridge circuits Design automation test generation Bridging faults fault selection fault simulation hard-to-detect faults
Content Type	Text
Resource Type	Article
Subject	Computer Graphics and Computer-Aided Design Electrical and Electronic Engineering Software

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