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Long-term characterization of 6h-sic transistor integrated circuit technology operating at 500 c
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Okojie, Robert S. Spry, David J. Chen, Liang-Yu Neudeck, Philip G. Chang, Carl W. Beheim, Glenn M. Ferrier, Terry L. Krasowski, Michael J. Evans, Laura J. Prokop, Norman F. |
| Copyright Year | 2008 |
| Description | NASA has been developing very high temperature semiconductor integrated circuits for use in the hot sections of aircraft engines and for Venus exploration. This paper reports on long-term 500 C electrical operation of prototype 6H-SiC integrated circuits based on epitaxial 6H-SiC junction field effect transistors (JFETs). As of this writing, some devices have surpassed 4000 hours of continuous 500 C electrical operation in oxidizing air atmosphere with minimal change in relevant electrical parameters.|||||||||||||||||||| |
| File Size | 588928 |
| Page Count | 6 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_20150022217 |
| Archival Resource Key | ark:/13960/t3vt6mt23 |
| Language | English |
| Publisher Date | 2008-03-24 |
| Access Restriction | Open |
| Subject Keyword | Electronics And Electrical Engineering Integrated Circuits Stability Field Effect Transistors Semiconductors Materials Meredith Roger D. Epitaxy Prototypes Jfet Transistor Circuits Silicon Carbides Durability High Temperature Environments Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |
