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Single-event effect report for epc series egan fets: the effect of load conditions on destructive see
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Scheick, Leif |
| Copyright Year | 2014 |
| Description | Recent testing of Enhanced Power Conversion (EPC) eGaN FET devices design for power use has shown that the devices are susceptible to Single-Event Effects (SEE) that degrade or destroy the device. The exact mechanism of the SEE is not known. The testing so far has been in the static condition, in the fully off condition, and with minimal load conditions. These conditions may not be worst case. This report presents the results of a study that tests some of the load conditions for SEE. The EPC2012 and EPC1012 were chosen for the test. The tests were performed the TAMU radiation effects facility in May and June of 2013. |
| File Size | 14684010 |
| Page Count | 26 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_20140011396 |
| Archival Resource Key | ark:/13960/t2d84b319 |
| Language | English |
| Publisher Date | 2014-01-01 |
| Access Restriction | Open |
| Subject Keyword | Electronics And Electrical Engineering Radiation Effects Destruction Field Effect Transistors Single Event Upsets Electric Generators Radiation Damage Loads Forces Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |
