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| Content Provider | The American Society of Mechanical Engineers (ASME) Digital Collection |
|---|---|
| Author | Boiadjieva, N. Koev, P. |
| Copyright Year | 2003 |
| Abstract | For through-silicon optical probing of microprocessors, the heat generated by devices with power over 100W must be dissipated [1]. To accommodate optical probing, a seemingly elaborate cooling system that controls the microprocessor temperature from 60 to 100° C for device power up to 150W was designed [2]. The system parameters to achieve the desired thermal debug environment were cooling air temperature and air flow. A mathematical model was developed to determine both device temperature and input power. The 3-D heat equation that governs the temperature distribution was simplified to a case of a 1-D rod with one end at the device center and the other at the cooling air intake. Thus the cooling system was reduced to an analytical expression. From experimental data, we computed all coefficients in the model, then ran extensive tests to verify—the accuracy was better than 10% over the entire temperature and power ranges. |
| Sponsorship | Electronic and Photonic Packaging Division |
| Starting Page | 553 |
| Ending Page | 557 |
| Page Count | 5 |
| File Format | |
| ISBN | 0791837149 |
| DOI | 10.1115/IMECE2003-42034 |
| Volume Number | Electronic and Photonic Packaging, Electrical Systems and Photonic Design, and Nanotechnology |
| Conference Proceedings | ASME 2003 International Mechanical Engineering Congress and Exposition |
| Language | English |
| Publisher Date | 2003-11-15 |
| Publisher Place | Washington, DC, USA |
| Access Restriction | Subscribed |
| Subject Keyword | 1-d non-uniform rod Heat spreader Mathematical thermal model Ic cooling Flat heat pipes Temperature distribution Temperature Heat Air flow Cooling Cooling systems Computer cooling Silicon |
| Content Type | Text |
| Resource Type | Article |
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