NDLI: Process variation characterization of chip-level multiprocessors

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Process variation characterization of chip-level multiprocessors

Content Provider	ACM Digital Library
Author	Dick, Robert P. Zhang, Lide Bai, Lan S. Shang, Li Joseph, Russ
Abstract	Within-die variation in leakage power consumption is substantial and increasing for chip-level multiprocessors (CMPs) and multiprocessor systems-on-chip. Dealing with this problem via conservative assumptions is sub-optimal. Instead, operating systems may adapt task assignment and power management decisions to the variable characteristics of cores, improving system-wide power consumption and performance. Researchers have proposed such adaptation techniques. However, they rely on knowledge of CMP process variation (PV) maps. These maps are not provided by processor vendors, providing them would impose additional cost during the testing process, and static maps would not permit adaptation to aging effects. Further progress on developing and validating PV aware control techniques for CMPs requires access to PV maps for real processors. We present an online technique to extract the PV maps of CMPs. Potentially automatic temperature measurements with built-in on-die sensors during the execution of characterization workloads are used to determine variation in leakage power consumption. The proposed technique is applied to real CMPs, and the resulting PV maps are used within a PV aware task assignment and scheduling algorithm.
Starting Page	694
Ending Page	697
Page Count	4
File Format	PDF
ISBN	9781605584973
DOI	10.1145/1629911.1630092
Language	English
Publisher	Association for Computing Machinery (ACM)
Publisher Date	2009-07-26
Publisher Place	New York
Access Restriction	Subscribed
Subject Keyword	Characterization Software Process variation
Content Type	Text
Resource Type	Article

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