NDLI: Defect tolerant probabilistic design paradigm for nanotechnologies

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EDA: this is serious business

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Defect tolerant probabilistic design paradigm for nanotechnologies

Content Provider	ACM Digital Library
Author	He, Chen Bijansky, Stephen Jacome, Margarida de Veciana, Gustavo
Abstract	Recent successes in the development and self-assembly of nanoelectronic devices suggest that the ability to manufacture dense nanofabrics is on the near horizon. However, the tremendous increase in device density of nanoelectronics will be accompanied by a substantial increase in hard and soft faults, posing a major challenge to current design methodologies and tools. In this paper we propose a novel probabilistic design paradigm for defective but reconfigurable nanofabrics. The new design goal is to devise an appropriate structural/behavioral decomposition which improves scalability by constraining the reconfiguration process, while meeting a desired probability of successful instantiation, i.e, yield. Our approach not only addresses the scalability problem in configuring dense nanofabrics subject to defects, but gives a rich framework in which critical trade-offs among performance, yield, and per chip cost can be explored. We present a concrete instance of the approach and show extensive experimental results supporting these claims.
Starting Page	596
Ending Page	601
Page Count	6
File Format	PDF
ISBN	1581138288
DOI	10.1145/996566.996730
Language	English
Publisher	Association for Computing Machinery (ACM)
Publisher Date	2004-06-07
Publisher Place	New York
Access Restriction	Subscribed
Subject Keyword	Nanotechnologies Probabilistic design Defect tolerance
Content Type	Text
Resource Type	Article

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