NDLI: A versatile paradigm for scan chain diagnosis of complex faults using signal processing techniques

Content Provider	ACM Digital Library
Author	Tzeng, Chao-Wen Huang, Shi-Yu Yang, Jheng-Syun
Copyright Year	2008
Abstract	Scan chains are popularly used as the channels for silicon testing and debugging. However, they have also been identified as one of the culprits of silicon failure more recently. To cope with this problem, several scan chain diagnosis approaches have been proposed in the past. The existing methods, however, suffer from one common drawback—that is, they rely on fault models and matching heuristics to locate the faults. Such a paradigm may run into difficulty when the fault under diagnosis does not match the fault model exactly, for example, when there is a bridging between a flip-flop and a logic cell, or the fault is temporal and only manifests itself intermittently. In light of this, we propose in this article a more versatile model-free paradigm for locating the faulty flip-flops in a scan chain, incorporating a number of signal processing techniques, such as filtering and edge detection. These techniques performed on the test responses of the failing chip under diagnosis directly can effectively reveal the fault location(s) in a scan chain. As compared to the previous works, our approach is better capable of handling intermittent faults and bridging faults, even under nonideal conditions, for example, when the core logic is also faulty. Experimental results on several real designs indicate that this approach can indeed catch some nasty faults that previous methods could not catch.
Starting Page	1
Ending Page	27
Page Count	27
File Format	PDF
ISSN	10844309
e-ISSN	15577309
DOI	10.1145/1297666.1297675
Volume Number	13
Issue Number	1
Journal	ACM Transactions on Design Automation of Electronic Systems (TODAES)
Language	English
Publisher	Association for Computing Machinery (ACM)
Publisher Date	2008-02-06
Publisher Place	New York
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Diagnosis Design for testability Fault Profiling Scan chain
Content Type	Text
Resource Type	Article
Subject	Computer Graphics and Computer-Aided Design Computer Science Applications Electrical and Electronic Engineering

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