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  1. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
  2. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 5
  3. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 5, Issue 1, February 2011
  4. X-ray interferometric investigation of deformation fields in ion-implanted silicon crystals
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Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 11
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 10
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 9
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 8
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 7
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 6
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 5
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 5, Issue 6, December 2011
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 5, Issue 5, October 2011
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 5, Issue 4, August 2011
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 5, Issue 3, June 2011
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 5, Issue 2, April 2011
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 5, Issue 1, February 2011
Features in phase-contrast images of micropipes in SiC in white synchrotron radiation beam
X-ray scattering and volumetric P-V-T studies of the dimyristoylphosphatidylcholine-water system
Study of the electronic structure of Al(III) and Zn(II) complexes with organic ligands by quantum chemistry and photoelectron spectroscopy methods
Initial stage of oxidation of titanium
Spreading of an SR beam spot (diameter 0.5 μm, 95 eV) photoelectron image on the surface of WO$_{3 − x }$ films
Determination of the reduction depth of tungsten oxide thin films under the effect of proton irradiation
Interaction of biological and nonbiological surfaces. New opportunities for research and technologies using synchrotron radiation
Spectroscopic investigations of wide-band fluoride crystals doped with ions of some rare-earth elements under X-ray excitation
X-ray photoelectron investigation of charge distribution in copper(II) phthalocyanine complexes
Diagnostics of height distribution of InAs/GaAs quantum dot arrays by means of carbon tetrachloride treatment in vapor phase epitaxy conditions
Mathematical modeling of the evolution of polaron states
Formation of oriented rodlike nickel silicide precipitates during magnetron deposition of carbon and nickel on silicon
Analysis of depth profiles of hydrogen isotopes in structural materials via reflected electron spectroscopy
The effect of different treatments on fractal forms of gallium arsenide surface
Calculation of the temperature-dependent energy characteristics of adsorption systems based on transition metals
Correlation between the energy of the ion scattered from the metal surface and its melting heat
Mechanochemical effects in titanium nickelide-stainless steel bilayer samples
A neutron reflectometer on thermal neutrons with variable wavelength
Magnetic ordering in Mn$_{3}$Sb determined by neutron diffraction data
Structure of complexes of sulphuretted tetraphenylporphine with poly-N-vinylpyrrolidone according to the data of small-angle neutron scattering
Effects of spatial ordering of quantum dot arrays from small-angle X-ray diffraction data under variation of growth parameters
Study of CdSe/CdS quantum dots in solutions and gels by small-angle X-ray scattering
Ab initio simulation of resonant forbidden reflections in Ge crystals
Synchrotron radiation interference in front of the silicon absorption edge for silicon-on-insulator structures
Influence of X-rays on optical properties of lithium tantalite crystals
X-ray interferometric investigation of deformation fields in ion-implanted silicon crystals
Features of the manufacture of deep X-ray lithography masks in the siberian synchrotron and terahertz radiation center
Structure and phase composition studies of partially stabilized zirconia
Ion-beam sputtering of quartz samples: Material properties observed in the mass spectra of secondary ions
Mobility restriction of charge carriers in bismuth films due to film block structure
Comparison of the dynamics of grid structures under thermal and radiation actions on amorphous Co-Ni-P alloys
Morphological, mechanical, corrosion and hydrogen permeation characteristics of Ni-nano-TiO$_{2}$ composite coating compared to Ni electrodeposited on low carbon steel
Floquet-bloch waves in bound one-dimensional photonic crystals
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 4
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 3
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 2
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 1

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X-ray interferometric investigation of deformation fields in ion-implanted silicon crystals

Content Provider Springer Nature Link
Author Drmeyan, H. R. Aboyan, A. H. Eyramjyan, F. H.
Copyright Year 2011
Abstract The results of investigation of deformation fields in the block of a three-crystal X-ray silicon interferometer subjected to ion implantation by X-ray diffraction moir patterns are presented. The condition of applicability of the expression to determine the moir pattern period when intracrystalline deformations are estimated has been found.
Starting Page 155
Ending Page 158
Page Count 4
File Format PDF
ISSN 10274510
Journal Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
Volume Number 5
Issue Number 1
e-ISSN 18197094
Language English
Publisher SP MAIK Nauka/Interperiodica
Publisher Date 2011-02-20
Publisher Place Dordrecht
Access Restriction One Nation One Subscription (ONOS)
Subject Keyword Surfaces and Interfaces, Thin Films
Content Type Text
Resource Type Article
Subject Nanoscience and Nanotechnology Surfaces, Coatings and Films
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