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  1. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
  2. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 4
  3. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 4, Issue 1, February 2010
  4. X-ray diffraction study of silicon single crystals highly doped with boron
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Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 11
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 10
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 9
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 8
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 7
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 6
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 5
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 4
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 4, Issue 6, November 2010
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 4, Issue 5, October 2010
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 4, Issue 4, August 2010
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 4, Issue 3, June 2010
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 4, Issue 2, April 2010
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 4, Issue 1, February 2010
Vacuum ultraviolet smoothing of nanometer-scale asperities of Poly(methyl methacrylate) surface
Electron-energy characteristics and the spectrum of one-electron states of the surfaces of ferric and nickel oxides with fluoropolymer coatings
The study of the bolometric response of detector elements based on nanostructured HTSC-films
Mathematical model of thermocracking of anisotropic brittle materials
Elimination of the background nonuniformity of the experimental contrast of single-crystal structural defects
X-ray diffraction study of silicon single crystals highly doped with boron
Properties of misfit dislocations and pseudodislocations not typical for defects of homogeneous crystals
Method to determine the interface’s fractal dimensions of metal-semiconductor electric contacts from their static instrumental characteristics
Secondary emission of carbon ions from graphite nanocrystallites
Surface micromorphology of CdTe(310) layers grown by molecular beam epitaxy
Features of photosensitive polycrystalline PbCdSe layers with a network-like structure
Electron microscopy studies of organic matter in rocks
Study of the surface microrelief of the titanium VT18u alloy after electrochemical dimensional processing
Description of the line shape of Bragg peak in neutron powder diffractometers taking into account spatial effects
Formation and destruction of polyelectrolyte microcapsules modified by rhodamine 6G
Preliminary characterization of semiconductor detectors in the soft X-ray range using synchrotron radiation from the VEPP-4 storage ring
X-ray diagnostics of semiconductor heterostructures: Some achievements and perspectives for development
Kinetic of poly(vinylidene fluoride) defluorination under X-ray irradiation
Annealing atmosphere effect on the processes of recrystallization of polycrystalline films of cadmium selenide
Study of thin Ge films with amorphous and nanocrystalline phases via the techniques of EXAFS spectroscopy and AFM
Structure and properties of copper coatings electrodeposited under X-ray radiation
Method for edge contour extraction of a scanning probe microscope image
Characterization of epitaxial n-GaP/p-PSi heterojunctions
On the effect of electric potential on resistance of metals’ surface to microindentation
Peculiarities of induced radiation and controlled dechanneling of relativistic particles in crystals under the Cherenkov—Vavilov extreme condition
The Region of gallium solubility in lead telluride films grown on silicon substrates
Heat transfer under heating of a surface with artificial submillimeter roughness
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 3
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 2
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 1

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X-ray diffraction study of silicon single crystals highly doped with boron

Content Provider Springer Nature Link
Author Shul’pina, I. L. Rouvimov, S. S. Kyutt, R. N.
Copyright Year 2010
Abstract The section Lang method of X-ray diffraction topography in combination with X-ray diffractometry based on the Borrmann effect was previously shown to be effective for detection of cluster formation during the growth process of highly doped Si-Cz single crystals. In the present work, the same techniques have been used to choose the best condition of technological heat treatment of boron-doped silicon from the view-point of formation of microdefects. The concentration and average size of dislocation loops have been calculated for two conditions of standard heat treatment from the analysis of diffusion scattering. The distribution of dislocation loops along the growth axis and crystal diameter has been determined as well.
Starting Page 32
Ending Page 35
Page Count 4
File Format PDF
ISSN 10274510
Journal Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
Volume Number 4
Issue Number 1
e-ISSN 18197094
Language English
Publisher SP MAIK Nauka/Interperiodica
Publisher Date 2010-03-01
Publisher Place Dordrecht
Access Restriction One Nation One Subscription (ONOS)
Subject Keyword Surfaces and Interfaces, Thin Films
Content Type Text
Resource Type Article
Subject Nanoscience and Nanotechnology Surfaces, Coatings and Films
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