NDLI: Thermoelectric Measurements on Sputtered ZnO/ZnS Multilayers

Content Provider	Springer Nature Link
Author	Homm, G. Piechotka, M. Kronenberger, A. Laufer, A. Gather, F. Hartung, D. Heiliger, C. Meyer, B. K. Klar, P. J. Steinmüller, S. O. Janek, J.
Copyright Year	2010
Abstract	Multilayer samples of alternating n-type ZnO and insulating ZnS layers were deposited by radiofrequency (RF) magnetron sputtering on glass substrates. The number of ZnO/ZnS periods was varied throughout the series to increase the number of interfaces, whilst keeping the ratio of total thicknesses of ZnO and ZnS constant. Scanning electron microscopy (SEM) revealed the individual layers, but also a columnar structure. The in-plane Seebeck coefficient S and electric conductivity σ were measured between 50 K and 300 K. The dependence of S and σ on thickness d of the individual ZnO layers can be modeled by introducing a narrow interface layer of high conductivity for d > 100 nm. At lower d, fluctuations of the interfaces lead to additional effects on S and σ which arise due to percolation and can be explained qualitatively in the framework of a network model.
Starting Page	1504
Ending Page	1509
Page Count	6
File Format	PDF
ISSN	03615235
Journal	Journal of Electronic Materials
Volume Number	39
Issue Number	9
e-ISSN	1543186X
Language	English
Publisher	Springer US
Publisher Date	2010-06-11
Publisher Place	Boston
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Thermoelectrics multilayers network model Solid State Physics Electronics and Microelectronics, Instrumentation Characterization and Evaluation of Materials Optical and Electronic Materials
Content Type	Text
Resource Type	Article
Subject	Materials Chemistry Electronic, Optical and Magnetic Materials Condensed Matter Physics Electrical and Electronic Engineering

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