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  1. Journal of Materials Science: Materials in Electronics
  2. Journal of Materials Science: Materials in Electronics : Volume 19
  3. Journal of Materials Science: Materials in Electronics : Volume 19, Issue 4, April 2008
  4. Characteristics of sol–gel dip coated Ceria films
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Journal of Materials Science: Materials in Electronics : Volume 28
Journal of Materials Science: Materials in Electronics : Volume 27
Journal of Materials Science: Materials in Electronics : Volume 26
Journal of Materials Science: Materials in Electronics : Volume 25
Journal of Materials Science: Materials in Electronics : Volume 24
Journal of Materials Science: Materials in Electronics : Volume 23
Journal of Materials Science: Materials in Electronics : Volume 22
Journal of Materials Science: Materials in Electronics : Volume 21
Journal of Materials Science: Materials in Electronics : Volume 20
Journal of Materials Science: Materials in Electronics : Volume 19
Journal of Materials Science: Materials in Electronics : Volume 19, Issue 12, December 2008
Journal of Materials Science: Materials in Electronics : Volume 19, Issue 1, Supplement,December 2008
Journal of Materials Science: Materials in Electronics : Volume 19, Issue 11, November 2008
Journal of Materials Science: Materials in Electronics : Volume 19, Issue 10, October 2008
Journal of Materials Science: Materials in Electronics : Volume 19, Issue 8-9, September 2008
Journal of Materials Science: Materials in Electronics : Volume 19, Issue 7, July 2008
Journal of Materials Science: Materials in Electronics : Volume 19, Issue 6, June 2008
Journal of Materials Science: Materials in Electronics : Volume 19, Issue 5, May 2008
Journal of Materials Science: Materials in Electronics : Volume 19, Issue 4, April 2008
Dependence of Cu/In ratio of structural and electrical characterization of CuInS$_{2}$ crystal
Raman scattering studies of ultrashallow Sb implants in strained Si
Modified thermoelectric figure of merit estimated from enhanced mobility of [100] oriented beta-FeSi$_{2}$ thin film
Determination of carrier mobility vs resistivity relation in Czochralski-grown n- and p-type Si$_{ x }$Ge$_{1−x }$ (0.93 < x < 0.96) single crystals
Synthesis and luminescent characterization of YAl$_{3}$(BO$_{3}$)$_{4}$:Tb$^{3+}$ phosphors
Modeling vacancy injection from the silicon/silicon-nitride interface
Microstructure and dielectric properties of BaTiO$_{3}$-based X7R ceramics
Thermal annealing behaviour on Schottky barrier parameters and structural properties of Au contacts to n-type GaN
Synthesis and luminescent properties of Sr$_{4}$Al$_{14}$O$_{25}$:Eu$^{2+}$ blue–green emitting phosphor for white light-emitting diodes (LEDs)
Investigation on the synthesis of (Zn$_{1−x}$Mg$_{x}$)TiO$_{3}$ and the modulation effect of CaTiO$_{3}$
Creep property of composite solders reinforced by nano-sized particles
PTCR characteristics of semiconducting barium titanate ceramics produced by high-energy ball-milling
Thickness dependence of refractive index and optical gap of PMMA layers prepared under electrical field
Characteristics of sol–gel dip coated Ceria films
Dielectric and piezoelectric characterization of PSZT–BT ceramics for capacitor applications
Microstructure and dielectric properties of BaZr$_{ x }$Ti$_{1−x }$O$_{3}$ ceramics
Size effects in small scaled lead-free solder joints
Electrical and morphological characterization of polyaniline/sulfonated poly(arylene ether sulfone) composite films
Thermal creep and fracture behaviors of the lead-free Sn–Ag–Cu–Bi solder interconnections under different stress levels
Journal of Materials Science: Materials in Electronics : Volume 19, Issue 3, March 2008
Journal of Materials Science: Materials in Electronics : Volume 19, Issue 2, February 2008
Journal of Materials Science: Materials in Electronics : Volume 19, Issue 1, January 2008
Journal of Materials Science: Materials in Electronics : Volume 18
Journal of Materials Science: Materials in Electronics : Volume 17
Journal of Materials Science: Materials in Electronics : Volume 16
Journal of Materials Science: Materials in Electronics : Volume 15
Journal of Materials Science: Materials in Electronics : Volume 14
Journal of Materials Science: Materials in Electronics : Volume 13
Journal of Materials Science: Materials in Electronics : Volume 12
Journal of Materials Science: Materials in Electronics : Volume 11
Journal of Materials Science: Materials in Electronics : Volume 10
Journal of Materials Science: Materials in Electronics : Volume 9
Journal of Materials Science: Materials in Electronics : Volume 8

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Characteristics of sol–gel dip coated Ceria films

Content Provider Springer Nature Link
Author Murali, K. R.
Copyright Year 2007
Abstract Cerium oxide(CeO$_{2}$) thin films were deposited by the sol–gel dip coating technique using cerium chloride, acrylamide and N,N bis methylene acrylamide. The as deposited films were heat-treated at different temperatures in air. X-ray diffraction studies indicated the films to be of single phase CeO$_{2}$. Optical bandgap in the range of 3.53–3.60 eV was obtained from optical studies. Laser Raman studies exhibited Raman bands around 457 cm$^{−1}$.
Starting Page 369
Ending Page 371
Page Count 3
File Format PDF
ISSN 09574522
Journal Journal of Materials Science: Materials in Electronics
Volume Number 19
Issue Number 4
e-ISSN 1573482X
Language English
Publisher Springer US
Publisher Date 2007-08-03
Publisher Place Boston
Access Restriction One Nation One Subscription (ONOS)
Subject Keyword Characterization and Evaluation of Materials Optical and Electronic Materials
Content Type Text
Resource Type Article
Subject Atomic and Molecular Physics, and Optics Biomaterials Biophysics Condensed Matter Physics Electronic, Optical and Magnetic Materials Bioengineering Electrical and Electronic Engineering Biomedical Engineering
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