NDLI: Characteristics of CeOx–VO$_{2}$ composite thin films synthesized by sol

Content Provider	Springer Nature Link
Author	Song, Linwei Huang, Wanxia Zhang, Yubo Li, Danxia Shi, Qiwu Zheng, Shuping Li, Na Xu, Yuanjie
Copyright Year	2013
Abstract	Pure vanadium dioxide (VO$_{2}$) and CeOx–VO$_{2}$ (1.5 < x < 2) composite thin films were grown on muscovite substrate by inorganic sol–gel process using vanadium pentaoxide and cerium(III) nitrate hexahydrate powder as precursor. The crystalline structure, morphology and phase transition properties of the thin films were systematically investigated by X-ray diffraction, Raman, X-ray photoelectron spectroscopy, FE-SEM and optical transmission measurements. High quality of the VO$_{2}$ and CeOx–VO$_{2}$ composite films were obtained, in which the relative fractions of +4 valence state vanadium were above 70 % though the concentrations of cerium reached 9.77 at %. However, much of cerium compounds were formed at the edge of grains and the addition of cerium resulted in more clearly defined grain boundaries as shown in SEM images. Meanwhile, the composite films exhibited excellent phase transition properties and the infrared transmittance decreased from about 70 to 10 % at λ = 4 μm bellow and above the metal–insulator phase transition temperature. The metal–insulator phase transition temperatures were quite similar with about 66 °C of the pure VO$_{2}$ and CeOx–VO$_{2}$ composite thin films. But hysteresis widths increased with more addition of cerium, due to the limiting effect of grain boundaries on the propagation of the phase transition. Particularly, the CeOx–VO$_{2}$ composite film with an addition of 7.82 at % Ce showed a largest hysteresis width with about 20.6 °C. In addition, the thermochromic performance of visible transmittance did not change obviously with more addition of cerium.
Starting Page	3496
Ending Page	3503
Page Count	8
File Format	PDF
ISSN	09574522
Journal	Journal of Materials Science: Materials in Electronics
Volume Number	24
Issue Number	9
e-ISSN	1573482X
Language	English
Publisher	Springer US
Publisher Date	2013-05-07
Publisher Place	Boston
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Optical and Electronic Materials Characterization and Evaluation of Materials
Content Type	Text
Resource Type	Article
Subject	Atomic and Molecular Physics, and Optics Biomaterials Biophysics Condensed Matter Physics Electronic, Optical and Magnetic Materials Bioengineering Electrical and Electronic Engineering Biomedical Engineering

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