NDLI: Analysis of co-tunneling effect in single-electronics simulation

Content Provider	Springer Nature Link
Author	Elabd, Ali A. EL Rabaie, EL Sayed M. Shalaby, Abdelaziz T.
Copyright Year	2016
Abstract	The effect of simultaneous tunneling events in single electronics is discussed. Single-electron circuits are classified into two types: small circuits with one island, and large circuits with multi-island systems. Simulations for each type are compared with theoretical and experimental results. Analytic equations for two tunnel junctions in series, as presented by the founders of the phenomenon (Averin and Nazarov in Single Charge Tunneling, pp. 217–248, 1992), and data measured from single-electron transistors are used to verify the co-tunneling current computations for small circuits. For the large circuit type, the results of our Minoufiya University Single Electronics Simulator (MUSES) for the outputs of a single-electron (SE) decimal-to-binary coded decimal (BCD) encoder with 16 islands are compared with the results of the widely accepted nanostructure simulator SIMON. Comparison of the simulation results with measured data for real large single-electron circuits is not possible as such circuits have not yet been manufactured. Thus, to validate these computations, we use a novel multi-island circuit designed specifically to model the emission from a hydrogen atom, comparing the MUSES computations for the photoresponse energies of the equivalent circuit for the hydrogen atom with the measured line intensities of the hydrogen spectrum. Moreover, simulation running times are considered for both co-tunneling and first-order tunneling.
Starting Page	1351
Ending Page	1360
Page Count	10
File Format	PDF
ISSN	15698025
Journal	Journal of Computational Electronics
Volume Number	15
Issue Number	4
e-ISSN	15728137
Language	English
Publisher	Springer US
Publisher Date	2016-11-03
Publisher Place	New York
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Single-electron circuits Quantum tunneling Co-tunneling Rare-events simulation MUSES Atomic emission modeling ApplicationMathematics/Computational Methods of Engineering Electrical Engineering Theoretical, Mathematical and Computational Physics Optical and Electronic Materials Mechanical Engineering
Content Type	Text
Resource Type	Article
Subject	Atomic and Molecular Physics, and Optics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering Modeling and Simulation

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