NDLI: Achieving high effective Q-factors in ultra-high vacuum dynamic force microscopy

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Achieving high effective Q-factors in ultra-high vacuum dynamic force microscopy

Content Provider	Semantic Scholar
Author	Lübbe, Jannis Troeger, L. P. Torbrügge, Stefan Bechstein, Ralf Richter, Christoph Kühnle, Angelika Reichling, Michael
Copyright Year	2010
Abstract	The effective Q-factor of the cantilever is one of the most important figures-of-merit for a non-contact atomic force microscope (NC-AFM) operated in ultra-high vacuum (UHV). We provide a comprehensive discussion of all effects influencing the Q-factor and compare measured Q-factors to results from simulations based on the dimensions of the cantilevers. We introduce a methodology to investigate in detail how the effective Q-factor depends on the fixation technique of the cantilever. Fixation loss is identified as a most important contribution in addition to the hitherto discussed effects and we describe a strategy for avoiding fixation loss and obtaining high effective Q-factors in the force microscope. We demonstrate for room temperature operation, that an optimum fixation yields an effective Q-factor for the NC-AFM measurement in UHV that is equal to the intrinsic value of the cantilever.
File Format	PDF HTM / HTML
Alternate Webpage(s)	https://pub.uni-bielefeld.de/download/2913827/2930748/MeasSciTechnol_21_2010_L%C3%BCbbe.pdf
Language	English
Access Restriction	Open
Subject Keyword	Atomic-force microscopy Clamping (graphics) Dimensions Display resolution Gradient Hearing Loss, High-Frequency Holder Device Component Inference Kilohertz Microscope Device Component Microscopy, Atomic Force Scanning Probe Microscopes (device) Sensorineural Hearing Loss (disorder) Simulation
Content Type	Text
Resource Type	Article

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