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Atomic force microscopy as a tool for atom manipulation.
| Content Provider | Semantic Scholar |
|---|---|
| Author | Custance, Oscar Pérez, Reinaldo Orilles Morita, Shin-ichi |
| Copyright Year | 2009 |
| Abstract | During the past 20 years, the manipulation of atoms and molecules at surfaces has allowed the construction and characterization of model systems that could, potentially, act as building blocks for future nanoscale devices. The majority of these experiments were performed with scanning tunnelling microscopy at cryogenic temperatures. Recently, it has been shown that another scanning probe technique, the atomic force microscope, is capable of positioning single atoms even at room temperature. Here, we review progress in the manipulation of atoms and molecules with the atomic force microscope, and discuss the new opportunities presented by this technique. |
| Starting Page | 290 |
| Ending Page | 293 |
| Page Count | 4 |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://www.uam.es/gruposinv/spmth/papers/2009_NatureNanotechnology_4_803_Custance_AFM.pdf |
| PubMed reference number | 19966795v1 |
| Alternate Webpage(s) | https://doi.org/10.1038/nnano.2009.347 |
| DOI | 10.1038/nnano.2009.347 |
| Journal | Nature nanotechnology |
| Volume Number | 4 |
| Issue Number | 12 |
| Language | English |
| Access Restriction | Open |
| Subject Keyword | Microscope Device Component Microscopy, Atomic Force Scanning Probe Microscopes (device) |
| Content Type | Text |
| Resource Type | Article |
