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Measurement Accuracy Improvement Based on the FDK Effect for CT Dimensional Metrology The University of Tokyo
| Content Provider | Semantic Scholar |
|---|---|
| Author | Suzuki, Haruka |
| Copyright Year | 2014 |
| Abstract | Recently, due to the capability of providing the internal and external geometric information of workpiece simultaneously, X-ray computed tomography (CT) entered the application field of dimensional metrology in industry. However, in this new field the CT technology cannot meet the high accuracy requirements due to many factors. As the cone beam reconstruction algorithm FDK has a severe effect on the CT measurement, this paper proposes a method to analyze the FDK (Feldkamp–Davis–Kress) effect independently form other factors by using the numerical phantoms of a sphere and a cylinder. After the feature and cause of the error are discussed, the method of measurement accuracy improvement is given. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://www.jstage.jst.go.jp/article/pscjspe/2014S/0/2014S_799/_pdf/-char/ja |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
