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The Diffraction of X-rays by Close-Packed Polytypic Crystals Containing Single Stacking Faults. II. Theory for Hexagonal and Rhombohedral Structures
| Content Provider | Semantic Scholar |
|---|---|
| Author | Michalski, Edward Kaczmarek, Slawomir Maksymilian Demianiuk, Mieczyslaw |
| Copyright Year | 1988 |
| Abstract | The general theory developed by Michalski [Acta Cryst. (1988), A44, 640-649] has been applied to the cases of hexagonal and rhombohedral structures. The symbols of stacking faults based on Zhdanov's symbols of local structure near the faults have been introduced and assigned to the formal subscripts j, k used in general theory. On this basis the regularities, according to which the faults with different subscripts j, k have the same structures, have been characterized. Then these regularities have been taken into consideration in the derivation of expressions for measurable parameters of changes (caused by faults) in the X-ray intensity distribution. The results obtained for structures 2H, 4H, 6H(33), 8H(44), 10H(55), 12H(66), 3C, 9R(12)3, 12R(13)3 and 15R(23)3 are given. Some results are compared with published data. The physical meaning of the assumption of small values of fault probabilities is discussed. |
| Starting Page | 650 |
| Ending Page | 657 |
| Page Count | 8 |
| File Format | PDF HTM / HTML |
| DOI | 10.1107/S0108767388003241 |
| Volume Number | 44 |
| Alternate Webpage(s) | http://journals.iucr.org/a/issues/1988/05/00/mn0336/mn0336.pdf |
| Alternate Webpage(s) | http://skaczmarek.zut.edu.pl/CRYSTALOGRAFICA.PDF |
| Alternate Webpage(s) | https://doi.org/10.1107/S0108767388003241 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
