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The Monte Carlo Simulation of Random Stacking Faults in Close-Packed Structures BY B. I. NIKOLIN AND A. Yu. BABKEVlCH
| Content Provider | Semantic Scholar |
|---|---|
| Author | Woolfson, Michael Mark |
| Copyright Year | 1989 |
| Abstract | A new approach to the estimation of the concentration of random stacking faults in close-packed structures (and also multilayers) is presented. It is based on the Monte Carlo computer simulation of the arrangement of stacking faults in a crystal, given by an appropriate h-k sequence. Thus the corresponding intensity (structure-factor) distribution along the streaked reciprocal-lattice rows may be calculated from nearly the same expression as for a perfect multilayer structure. In particular, good agreement is observed with the computations on the basis of the intensity equations derived for several particular cases. Some peculiarities in the diffracted intensity distribution of crystals with multilayer structures containing random stacking faults of different types, or having different dimensions of the hexagonal unit cell, are pointed out. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | http://journals.iucr.org/a/issues/1989/11/00/bw0589/bw0589.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
