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A mission profile-based reliability analysis framework for photovoltaic DC-DC converters
Content Provider | Scilit |
---|---|
Author | Sande, W. Van De Ravyts, S. Sangwongwanich, A. Manganiello, P. Yang, Y. Blaabjerg, F. Driesen, J. Daenen, M. |
Copyright Year | 2019 |
Description | Journal: Microelectronics Reliability |
Related Links | https://zenodo.org/record/3479408/files/ESREF_2019_first_submitted.pdf |
ISSN | 00262714 |
DOI | 10.1016/j.microrel.2019.06.075 |
Journal | Microelectronics Reliability |
Volume Number | 100-101 |
Language | English |
Publisher | Elsevier BV |
Publisher Date | 2019-09-01 |
Access Restriction | Open |
Subject Keyword | Journal: Microelectronics Reliability |
Content Type | Text |
Resource Type | Article |
Subject | Nanoscience and Nanotechnology Surfaces, Coatings and Films Atomic and Molecular Physics, and Optics Electronic, Optical and Magnetic Materials Condensed Matter Physics Safety, Risk, Reliability and Quality Electrical and Electronic Engineering |