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X-ray fluorescence element-mapping spectrometer with improved spatial resolution
| Content Provider | Scilit |
|---|---|
| Author | Kobayashi, Y. Fukumoto, N. Kurahashi, M. |
| Copyright Year | 1991 |
| Description | Journal: Measurement Science and Technology A new system for element mapping by x-ray fluorescence spectrometry with spatial resolution better than 20 micrometres has been developed. A finely focused exciting beam is generated by collimating x-rays from a fine focus tube through an x-ray guide tube. Fluorescence x-rays are effectively detected by two Si(Li) detectors of large sensitive area, placed in close proximity to a two-dimensional scanning stage. Counting rates for the elements with Z between 16 and 27 are comparable to those of the previous system with the resolution of abour 200 micrometres. |
| Related Links | http://iopscience.iop.org/article/10.1088/0957-0233/2/2/018/pdf |
| Ending Page | 184 |
| Page Count | 2 |
| Starting Page | 183 |
| ISSN | 09570233 |
| e-ISSN | 13616501 |
| DOI | 10.1088/0957-0233/2/2/018 |
| Journal | Measurement Science and Technology |
| Issue Number | 2 |
| Volume Number | 2 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 1991-02-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Measurement Science and Technology X Ray Fluorescence Spatial Resolution |
| Content Type | Text |
| Resource Type | Article |
| Subject | Applied Mathematics Instrumentation Engineering |
