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A high-resolution vacuum ultraviolet spectrometer for plasma spectroscopy
| Content Provider | Scilit |
|---|---|
| Author | Meijer, F. G. |
| Copyright Year | 1999 |
| Description | Journal: Measurement Science and Technology A high-resolution spectrometer for the wavelength range 40-200 nm was adapted to a high-speed photo-electric detection system. A wavelength range of 3 nm can be measured up to every 0.2 ms with a resolution of 0.0012 nm and a wavelength accuracy of 0.0001 nm. The system is used for plasma spectroscopy at the Rijnhuizen Tokamak Project. Temperature measurements were performed with a resolution of 0.1 eV and changes in rotation velocity of were observed. |
| Related Links | http://iopscience.iop.org/article/10.1088/0957-0233/10/5/005/pdf |
| Ending Page | 373 |
| Page Count | 7 |
| Starting Page | 367 |
| ISSN | 09570233 |
| e-ISSN | 13616501 |
| DOI | 10.1088/0957-0233/10/5/005 |
| Journal | Measurement Science and Technology |
| Issue Number | 5 |
| Volume Number | 10 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 1999-01-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Measurement Science and Technology Temperature Measurement |
| Content Type | Text |
| Resource Type | Article |
| Subject | Applied Mathematics Instrumentation Engineering |