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Resolution enhancement for a commercial X-ray fluorescence spectrometer
| Content Provider | Scilit |
|---|---|
| Author | Haycock, D. E. Urch, D. S. |
| Copyright Year | 1982 |
| Description | Journal: Journal of Physics E: Scientific Instruments The construction of an additional collimator is described which removes asymmetric long wavelength tails from X-ray emission peaks. The resulting spectra can be subjected to deconvolution procedures, based on Fourier analysis, which reduce the broadening due to the primary collimator. The final spectra are very similar, in quality and resolution, to those obtained from double crystal spectrometers. |
| Related Links | http://iopscience.iop.org/article/10.1088/0022-3735/15/1/005/pdf |
| Ending Page | 43 |
| Page Count | 4 |
| Starting Page | 40 |
| ISSN | 00223735 |
| DOI | 10.1088/0022-3735/15/1/005 |
| Journal | Journal of Physics E: Scientific Instruments |
| Issue Number | 1 |
| Volume Number | 15 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 1982-01-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Journal of Physics E: Scientific Instruments Characterization and Testing of Materials X Ray Fluorescence Fourier Analysis |
| Content Type | Text |
| Resource Type | Article |
| Subject | Physics and Astronomy Instrumentation Engineering Materials Science |