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Dynamical multibeam simulation for (LA)CBED investigations of imperfect silicon
| Content Provider | Scilit |
|---|---|
| Author | Kenda, A. Cerva, H. Pongratz, P. |
| Copyright Year | 2018 |
| Description | A dynamical multibeam simulation software for EDCI, CBED, and LACBED applications of distorted crystals is presented. It is based on Bloch wave theory, including the entire HOLZ interactions. The simulation package is designed to handle arbitrary strain configurations for processing a variety of analytical and numerical models. Preliminary results have been obtained for defect analysis. LACBED patterns of dislocations have been simulated with multibeam diffraction conditions, and matched with experimental images. Book Name: Microscopy of Semiconducting Materials 2001 |
| Related Links | https://api.taylorfrancis.com/content/chapters/edit/download?identifierName=doi&identifierValue=10.1201/9781351074629-102&type=chapterpdf |
| Ending Page | 480 |
| Page Count | 4 |
| Starting Page | 477 |
| DOI | 10.1201/9781351074629-102 |
| Language | English |
| Publisher | Informa UK Limited |
| Publisher Date | 2018-01-18 |
| Access Restriction | Open |
| Subject Keyword | Book Name: Microscopy of Semiconducting Materials 2001 Package Multibeam Simulation Models Imperfect Defect Experimental Distorted |
| Content Type | Text |
| Resource Type | Chapter |