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Characterization of Various Interfaces Structure in a Titanium Alloy Using Aberration-Corrected Scanning Transmission Electron Microscope
| Content Provider | Scilit |
|---|---|
| Author | Zheng, Y. Williams, R. E. A. Fraser, H. L. |
| Copyright Year | 2015 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/06C8898A9313DBB202F73FDE7470E137/S1431927615008363a.pdf/div-class-title-characterization-of-various-interfaces-structure-in-a-titanium-alloy-using-aberration-corrected-scanning-transmission-electron-microscope-div.pdf |
| Ending Page | 1518 |
| Page Count | 2 |
| Starting Page | 1517 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/S1431927615008363 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S3 |
| Volume Number | 21 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2015-08-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |