NDLI: Physical property exploration of highly oriented V<sub>2</sub>O<sub>5</sub> thin films prepared by electron beam evaporation

Content Provider	Royal Society of Chemistry (RSC)
Author	Thaiyan, Mahalingam Ganesan, Ravi Thiagarajan, Shrividhya
Copyright Year	2015
Abstract	Highly oriented vanadium pentoxide (V2O5) thin films were grown by electron beam (EB) evaporation on glass substrates at 473 K. V2O5 thin films were coated with various thicknesses (≈800–1200 nm) by varying the distance from the source and substrates. The influence of film thickness on its physical properties was deeply studied by various characterization techniques. XRD studies were performed to investigate the structural confirmation and preferential lattice orientation of EB evaporated films. The Voigt profile method was used to estimate the microstructural parameters and to elaborately discuss its dependency on film thickness. SEM micrographs perceived that the prepared films were nearly homogeneous with densely packed morphology. AFM topographical images depicted the nanograins on the surface of the films. Raman spectra confirmed the formation of the α-V2O5 polymorph without secondary phase formation. From the optical absorption data, the indirect optical band gap ‘Eg’ was found to be 2.36 eV for V2O5 thin film with higher thickness. Optical constants such as refractive index (n), extinction coefficient (k), optical conductivity (σ) and dielectric constants (ε) were evaluated using an approximation protocol developed from well recognized procedures using the data obtained from the UV-Vis spectroscopic technique. The luminescence property variations were observed by photoluminescence (PL) spectroscopy and it has elucidated the role of film thickness in the EB evaporated V2O5 films. The Hall mobility and carrier density were found to increase with film thickness.
Starting Page	9471
Ending Page	9479
Page Count	9
File Format	HTM / HTML PDF
ISSN	11440546
Volume Number	39
Issue Number	12
Journal	New Journal of Chemistry
DOI	10.1039/c5nj01582k
Language	English
Publisher	Royal Society of Chemistry
Access Restriction	Open
Subject Keyword	Spectroscopy Vanadium(V) oxide Refractive index Luminescence Photoluminescence Electronvolt Dielectric Thin film X-ray crystallography Voigt Electron mobility Raman Band gap Voigt profile Shapeshifting Crystal structure
Content Type	Text
Resource Type	Article
Subject	Chemistry Materials Chemistry Catalysis

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