NDLI: Synthesis and evaluation of new copper ketoiminate precursors for a facile and additive-free solution-based approach to nanoscale copper oxide thin films

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Dalton Transactions Vol - 46 Issue - 7

Dalton Transactions Vol - 46 Issue - 6

Dalton Transactions Vol - 46 Issue - 5

Dalton Transactions Vol - 46 Issue - 4

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Dalton Transactions Vol - 46 Issue - 2

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Dalton Transactions Vol -0

Synthesis and evaluation of new copper ketoiminate precursors for a facile and additive-free solution-based approach to nanoscale copper oxide thin films

Content Provider	Royal Society of Chemistry (RSC)
Author	Becker, Hans-Werner Grafen, Markus Rogalla, Detlef Ludwig, Arne Ostendorf, Andreas Devi, Anjana Karle, Sarah Wieck, Andreas Dirk
Copyright Year	2017
Abstract	Novel copper ketoiminate compounds were synthesized and for the first time applied for additive-free solution-based deposition of nanoscale copper oxide thin films. The two closely related compounds, namely the bis[4-(2-ethoxyethyl-imino)-3-pentanonato]copper, [Cu(EEKI)2], and bis[4-(3-methoxypropylimino)-3-pentanonato]copper, [Cu(MPKI)2], were characterized by means of elemental and thermogravimetric analysis (TGA), as well as electron impact mass spectrometry (EI-MS). The advantages of these compounds are that they are liquid and possess excellent solubility in common organic solvents in addition to an optimum reactivity towards ambient moisture that enables a facile solution-based approach to nanoscale copper oxide thin films. Moreover, no additives or aging is needed to stabilize the solution processing of the copper oxide layers. [Cu(MPKI)2] was tested in detail for the deposition of copper oxide thin films by spin coating. Upon one-step annealing, high-quality, uniform, crystalline copper oxide thin films were deposited on Si, SiO2, as well as on quartz substrates. Structural, morphological and compositional characteristics of the copper oxide nanostructures were investigated in detail by means of X-ray diffraction (XRD), scanning electron microscopy (SEM), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), and a combined analysis using Rutherford backscattering spectroscopy (RBS) and nuclear reaction analysis (NRA). It was possible to control the copper oxide phases (CuO and Cu2O) by systematic tuning of the post-deposition annealing conditions. The functional properties in terms of optical band gap were investigated using UV/Vis spectroscopy, while the transport properties, such as resistivity, mobility and carrier concentration were analyzed employing Hall measurements, which confirmed the p-type conductivity of the copper oxide layers.
Starting Page	2670
Ending Page	2679
Page Count	10
File Format	HTM / HTML PDF
ISSN	14779226
Volume Number	46
Issue Number	8
Journal	Dalton Transactions
DOI	10.1039/c6dt04399b
Language	English
Publisher	Royal Society of Chemistry
Access Restriction	Open
Subject Keyword	EEKI NRA Raman Copper High-temperature superconductivity Thermogravimetric analysis Mass spectrometry Spin coating Nucleic acid thermodynamics Quartz X-ray crystallography Scanning electron microscope Raman spectroscopy X-ray photoelectron spectroscopy Photoemission spectroscopy Rutherford backscattering spectrometry Nuclear reaction analysis Copper(II) oxide Band gap Willem C. Vis Moot Spectroscopy Electrical resistivity and conductivity Extrinsic semiconductor
Content Type	Text
Resource Type	Article
Subject	Inorganic Chemistry

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Synthesis and evaluation of new copper ketoiminate precursors for a facile and additive-free solution-based approach to nanoscale copper oxide thin films

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