NDLI: Interface circuit for measuring small capacitance changes in sensor networks

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Extending the reverberation chamber using a channel emulator for characterisation of over-the-air performance of multiple-input–multiple-output wireless devices

Guest Editorial: IET Science, Measurement & Technology Volume 9, Issue 5, August 1

Interface circuit for measuring small capacitance changes in sensor networks

Mode-stirred reverberating chamber autocorrelation function: model, multifrequency measurements and applications

Optimisation of a concentration measurement sensor for nano sized zero valent iron using numerical simulation

Proximity-effect test for lossy wireless-device measurements in reverberation chambers

Radio interference excitation function of conductor bundles based on cage test results and comparison with long-term data

Sensitivity-based optimal shape design of induction-heating devices

Use of electric field orientation as an index for estimating the contribution of model complexity in transcranial direct current stimulation forward head model development

Verification of the Rician K-factor-based uncertainty model for measurements in reverberation chambers

Wireless coexistence and interference test method for low-power wireless sensor networks

Volume 9 (2015) : Issue 4, Jul

Volume 9 (2015) : Issue 3, May

Volume 9 (2015) : Issue 2, Mar

Volume 9 (2015) : Issue 1, Jan

IET Signal Processing

IET Wireless Sensor Systems

Micro & Nano Letters

The Journal of Engineering

Interface circuit for measuring small capacitance changes in sensor networks

Content Provider	IET Digital Library
Author	Pintér, Ákos Dénes, István
Abstract	This study describes a novel circuit configuration, capable of handling fast transients and small capacitance changes by the evaluation of the signals of a capacitive sensor network. The circuit is based on a conventional bridge measurement method being complemented with a control loop and high-order filters in order to cancel the effect of the environmental interference, the in-circuit noise, the propagation delay of the measuring signal and the parasitic elements. Through the first circuit tests, applying to the proposed measurement configuration, it was possible to detect capacitance changes in the order of 100 ppm of the nominal capacitance value with a sampling frequency of 2 kHz. The state of the art measurement configurations compare the rectified measurement signal of the capacitive sensor with that of a reference capacitance. The difference signal, already having a considerable noise content because of the diode-rectification is then further amplified. The measurement configuration proposed in the study is however amplifying the difference of the unrectified signals. Owing to the rectification being applied only after the gain stage, the noise of the rectifier unit is considerably smaller compared with other solutions. This method is having further potentials especially by means of measurement speed and accuracy.
Starting Page	570
Ending Page	578
Page Count	9
ISSN	17518822
Volume Number	9
e-ISSN	17518830
Issue Number	Issue 5, Aug (2015)
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/iet-smt/9/5
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/10.1049/iet-smt.2014.0221
Journal	IET Science, Measurement & Technology
Publisher Date	2015-03-18
Access Restriction	Open
Rights Holder	© The Institution of Engineering and Technology
Subject Keyword	Bridge Circuit Bridge Measurement Method Capacitance Change Measurement Configuration Capacitance Measurement Capacitive Sensor Capacitive Sensor Network Common Mode Noise Rejection Control Loop Diode Rectification Electrical Instruments And Technique Electromagnetic Compatibility Environmental Interference Cancellation Filtering Method in Signal Processing Filtering Theory Frequency 2 KHz High-order Filter Higher Order Statistics Impedance And Admittance Measurement In-circuit Noise Integrated Circuit Noise Interface Circuit Interference Interference Suppression Measuring Signal Rectification Parasitic Element Probability Theory Propagation Delay Rectification Rectifier Rectifier Unit Sensing And Detecting Device Sensing Device And Transducers Signal Evaluation Statistics Stochastic Linearised SCUC Stray Capacitance
Content Type	Text
Resource Type	Article
Subject	Atomic and Molecular Physics, and Optics Electrical and Electronic Engineering

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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