NDLI: Comparisons of three modelling methods for the forward problem in three-dimensional electrical capacitance tomography

Content Provider	IET Digital Library
Author	Yan, Hua Sun, Yan Hui Wang, Yi Fan Zhou, Ying Gang
Abstract	Image reconstruction of electrical capacitance tomography (ECT) belongs to solving an inverse problem. The first step to solve the inverse problem is to establish a forward problem model which determines the capacitance values for known permittivity distribution. There are three main methods for ECT forward problem modelling. The first is based on the sensitivity definition. The second is based on the multiple linear regression (MLR) method. And the third is based on the electric field strength (EFS). In this study, comparisons of these three modelling methods for the forward problem in three-dimensional ECT are given in terms of modelling error, computational time and reconstruction quality. Comparison results show that the MLR method generates smallest modelling error and better reconstruction quality, especially for the very complex geometry with objects in the shape of letters H and U. However, the EFS method is significantly better than the other two methods in computational time.
Starting Page	615
Ending Page	620
Page Count	6
ISSN	17518822
Volume Number	9
e-ISSN	17518830
Issue Number	Issue 5, Aug (2015)
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/iet-smt/9/5
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/10.1049/iet-smt.2014.0252
Journal	IET Science, Measurement & Technology
Publisher Date	2015-03-18
Access Restriction	Open
Rights Holder	© The Institution of Engineering and Technology
Subject Keyword	3D ECT 3D Electrical Capacitance Tomography Capacitance Measurement Complex Geometry Computerised Instrumentation Computerised Tomography EFS Method Electric Field Measurement Electric Field Strength Electric Impedance Imaging Electrical Instruments And Technique Forward Problem Model Image Reconstruction Impedance And Admittance Measurement Inverse Problem Measurement Error MLR Method Modelling Error Modelling Method Multiple Linear Regression Method Permittivity Distribution Photonic Technology Probability Theory Regression Analysis Statistics Stochastic Linearised SCUC
Content Type	Text
Resource Type	Article
Subject	Atomic and Molecular Physics, and Optics Electrical and Electronic Engineering

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