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| Content Provider | IET Digital Library |
|---|---|
| Author | Chen, Meihui Chen, Hua Fan, Limin Feng, Dengguo |
| Abstract | It is important to study the correlation of randomness statistical tests The correlation of templates in non-overlapping template matching test is studied. The correlation degree between templates is defined and a correlation theorem is presented. For two different m-bit templates, when the last m−1 bits of one are equal to the first m−1 bits of the other one, correlation degree of them reaches the maximum value. Correlation experiments are also carried out and the results agree with the theorem. Finally, an effective selection strategy is proposed and the number of templates can be reduced about 50%. |
| Starting Page | 1533 |
| Ending Page | 1535 |
| Page Count | 3 |
| ISSN | 00135194 |
| Volume Number | 52 |
| e-ISSN | 1350911X |
| Issue Number | Issue 18, Sep (2016) |
| Alternate Webpage(s) | https://digital-library.theiet.org/content/journals/el/52/18 |
| Alternate Webpage(s) | https://digital-library.theiet.org/content/journals/10.1049/el.2016.0260 |
| Journal | Electronics Letters |
| Publisher Date | 2016-08-12 |
| Access Restriction | Open |
| Rights Holder | © The Institution of Engineering and Technology |
| Subject Keyword | Correlation Degree Correlation Theorem Correlation Theory Cryptography M-bit TemPlate Nonoverlapping Template Matching Test Pattern Recognition Randomness Statistical Tests Statistical Testing Statistics String Matching TemPlate Selection |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electrical and Electronic Engineering |
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