NDLI: Research on non-invasive measurement for the early diagnosis of diabetic peripheral neuropathy

Content Provider	IEEE Xplore Digital Library
Author	Chen Haifeng Dengqinkai
Copyright Year	2005
Description	Author affiliation: Medicine & Med. Equip. Test Inst., Nanjing Command, Jiangsu, China (Chen Haifeng)
Abstract	Various complications cause the main damage of diabetic mellitus (DM). Diabetic peripheral neuropathy (DPN) is one of the most common syndromes of the DM. Based on the clinic requirement, we develop a new instrument and do research on non-invasive measurement for the early diagnosis of the DPN by nerve conduction studies. Our work is consisted of two parts: (1) combining the virtual instrument technology with single chip microcomputer (SCM) module to make an instrument for non-invasive measurement; (2) doing clinic tests to find the quantitative indices of nerve electrophysiological characters for the early diagnosis of DPN by statistics. The prototype instrument is composed of two parts: SCM module and PC. The weak nerve conduction signals in company with strong noise are processed and recognized by signal averaging and cross correlation. The operating software is designed by the virtual instrument workbench-LabVIEW. 60 DM patients were examined by the prototype instrument to collect the electrophysiological parameters. We concluded that the SCV of the sural nerve and the minimal F-wave latency of the fibular nerve have a higher degree of sensitivity in the early diagnosis of DPN by statistic. By the discriminative analysis, we find the consistency of some electrophysiological data with clinic criteria.
Sponsorship	Huazhong Univ. of Sci. and Technol. (China) Arizona State Univ. (USA) Tsinghua Univ. (China)
Starting Page	79
Ending Page	83
File Size	618243
Page Count	5
File Format	PDF
ISBN	0780389026
DOI	10.1109/ICNIC.2005.1499847
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-05-28
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Semiconductor device measurement Software prototyping Statistical analysis Instruments Electrophysiology Signal processing Microcomputers Delta modulation Diabetes Testing
Content Type	Text
Resource Type	Article

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