NDLI: Drawing Defendable Conclusions from Effects Tests using Pulse Illumination of Electronic Systems

Content Provider	IEEE Xplore Digital Library
Author	Gardner, R.L.
Copyright Year	2006
Abstract	Engineers spend a great deal of time and effort collecting effects data on the illumination of electronic systems by electromagnetic waves. The effects can include upset or damage to the devices. The overall goal of these data is to draw conclusions about conditions that will allow the prediction of future failures of electronic systems of the same type or application. Illumination sources can include lightning, electromagnetic interference or high-power microwaves. It is rare that the engineer is allowed to take sufficient data to meet the usual statistical tests for conclusions about the data, yet those tests limit the applicability of the conclusions. This paper will outline the general statistical requirements by presenting general models. Applicability of those models will be extended using physical constraints and examples will be shown
Starting Page	335
Ending Page	337
File Size	228681
Page Count	3
File Format	PDF
ISBN	1424405130
DOI	10.1109/UWBUS.2006.307248
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-09-18
Publisher Place	Ukraine
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	System testing susceptibility Engineering drawings Electromagnetic scattering Electromagnetic interference Electronic equipment testing Lighting Lightning Microwave devices Data engineering Systems engineering and theory statistical model
Content Type	Text
Resource Type	Article

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