NDLI: Weighted test generator in built-in self-test design based on genetic algorithm and cellular automata

Content Provider	IEEE Xplore Digital Library
Author	Tan Enmin Song Shengdong Zhan Yan
Copyright Year	2011
Description	Author affiliation: School of Electronic Engineering and Automation, Guilin University of Electronic Technology, Jinji 541004, China (Tan Enmin; Song Shengdong; Zhan Yan)
Abstract	Weighted pattern generation is an effective method for cutting down the test length of pseudorandom test pattern set in a built-in self-test (BIST) design. For its natural weighting structure without additional hardware overhead, cellular automata (CA) was applied as test pattern generator of BIST in this paper. Furthermore, optimizing schemes based on genetic algorithm (GA) were also adopted so as to approach the desired weight of circuit under test (CUT) more efficaciously. Preparative programs consists of encoding the rules of a CA, constructing chromosome, calculating fitness of the chromosome, and selecting an individual for performing genetic operations, etc‥ Then, the characteristic of the individual is evaluated by judging whether the obtained weight is an approximate value to the desired weight or not. Finally, an optimized rule value set was searched and therefore an actual weight set and corresponding test set are also achieved. Experimental results based on some ISCAS'85 benchmark circuits show that this weighted pattern generation structure with CA based on GA is efficient in diagnosing some difficultly-detected faults and improving fault coverage.
Starting Page	134
Ending Page	138
File Size	109007
Page Count	5
File Format	PDF
ISBN	9781424481583
e-ISBN	9781424481613
DOI	10.1109/ICEMI.2011.6037782
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-08-16
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	genetic algorithm Automata BIST Built-in self-test weight Generators Encoding Circuit faults Arrays Genetic algorithms cellular automata weighted test generator
Content Type	Text
Resource Type	Article

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