NDLI: Structural and ferroelectric properties of tantalum-doped bismuth titanate thin films prepared by sol-gel method

Content Provider	IEEE Xplore Digital Library
Author	Chen, H.Z. Kao, M.C. Young, S.L. Chiang, J.L.
Copyright Year	2011
Description	Author affiliation: Department of Electronic Engineering, Hsiuping Institute of Technology, Taichung, Taiwan (Chen, H.Z.; Kao, M.C.; Young, S.L.) \|\| Department of Electronic Engineering, Chung Chou Institute of Technology, Changhua, Taiwan (Chiang, J.L.)
Abstract	Bi4Ti2.96Ta0.04O12 (BTTO) thin films were deposited on Pt(111)/Ti/SiO2/Si(100) substrates by sol–gel method. The effects of Ta-substitution and annealing temperature (500–800 °C) on the microstructure and ferroelectric properties of Bi4Ti3O12 thin films were investigated. X-Ray diffraction analysis reveals that the intensities of (117) peaks are realitively broad and weak at annealing temperatures smaller than 700 °C. With the increase of annealing temperature from 500 °C to 800 °C, the grain size of BTTO thin films increases. The BTTO thin films annealed at 700 °C exhibit the highest remanent polarization (2Pr) of 40 $μC/cm^{2}$ and lowest coercive field (2Ec) of 120 kV/cm. It is obvious that the measured 2Pr of the BTTO thin film is larger than that of Bi4Ti3O12 thin films (2Pr=25 $μC/cm^{2})$ The improved ferroelectric properties can be attributed to the substitution of $Ta^{5+}$ to $Ti^{4+}$ in Bi4Ti3O12 assisted the elimination of defects such as oxygen vacancy and vacancy complexes.
Starting Page	1
Ending Page	2
File Size	313819
Page Count	2
File Format	PDF
ISBN	9781457703799
ISSN	21593531
e-ISBN	9781457703782
e-ISBN	9781457703775
DOI	10.1109/INEC.2011.5991741
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-06-21
Publisher Place	Taiwan
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	ferroelectric Annealing X-ray scattering Films remanent polarization Surface morphology bismuth titanate Bismuth thin film Microstructure Substrates
Content Type	Text
Resource Type	Article

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