NDLI: LXI C Class Device Design in LAN Based ATE

Content Provider	IEEE Xplore Digital Library
Author	Mei Yuan Dahai Wang
Copyright Year	2006
Description	Author affiliation: Sch. of Autom. Sci. & Electr. Eng., Beijing Univ. of Aeronaut. & Astronaut., Beijing (Mei Yuan; Dahai Wang)
Abstract	Testing instruments are usually integrated into ATE (automatic testing equipment) systems. A lot of factors should be taken into account, such as size, weight, cost, speed, modularity and interoperation and so on. So the interface of the instrument device is important in design. LAN is a popular standard industry I/O. The high speed can meet the needs of ATE. It will provide a good tool to establish an automation testing system, especially distributed system. The research on establishing ATE with LAN will be hot in measurement and testing industry. LXI (LAN extensions for instrumentation) , which is a LAN-based modular instrumentation platform standard, takes advantages of VXI bus and LAN to provide users a well-defined platform. It will play an important role in next-generation LAN-based ATE. The paper discusses conventional instrument and LXI instrument. Obvious advantages of LXI instrument are given out. A LXI C class digital multimeter example is given out. The hardware and software block diagram is discussed. The LXI compatibility Web page is shown. It provides an approach to design a LAN-based instrument. At last, a conclusion is drawn that LAN-based instrument will play an important role in the next-generation automatic test system.
Starting Page	995
Ending Page	999
File Size	4820886
Page Count	5
File Format	PDF
ISBN	0780397002
DOI	10.1109/INDIN.2006.275733
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-08-16
Publisher Place	Singapore
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	System testing Costs Synthetic Instrument Instruments DMM Electronic equipment testing Communication system control Extraterrestrial measurements Automatic testing LAN-Based ATE Aerospace testing Hardware LXI Local area networks
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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Creating hybrid test and measurement system based on LAN/LXI

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Replacing the DMM instrument in legacy ATE applications

Research on key technique of general purpose ATE model

Development and design of a virtual instrument based on LXI technology

Design and Realization of Communication Module of LXI Data Interface Based on MCU

Research on LXI Triggering Modes

LXI C Class Device Design in LAN Based ATE

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