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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Xu Wang Hongyan Yang Ying Yuan Wuchen Wu |
| Copyright Year | 2012 |
| Description | Author affiliation: VLSI and System Lab, Beijing University of Technology, China (Xu Wang; Hongyan Yang; Ying Yuan; Wuchen Wu) |
| Abstract | A multi-channel charge readout integrated circuit (IC) which converts detector charge to analog voltage with offset calibration for X-ray industrial inspection is described. The charge readout IC provides 64 channels of circuit having a max dynamic range of 14 bit and is comprised of charge amplifier gain control, timing generator, shift register chain, charge amplifier array, sample/hold (S/H) stage amplifier and driver etc. It was fabricated using 0.8 um standard CMOS process, and occupies a die area of 3.1 mm × 10.9 mm. It operates at 4 MHz, consumes 45 mW from 5 V supply and 3.5 V as reference, and has a demonstrated output noise performance of 600 uVrms on 0.5 pF of charge amplifier gain capacitance and 33 pF of photodiode (PD) terminal capacitance. |
| Starting Page | 1677 |
| Ending Page | 1680 |
| File Size | 372820 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781467309653 |
| e-ISBN | 9781467309646 |
| DOI | 10.1109/CISP.2012.6469897 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2012-10-16 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Integrated circuits X-ray industrial inspection Offset calibration Noise Detectors Inspection Dynamic range Capacitance Calibration X-ray imaging Multi-channel charge readout IC |
| Content Type | Text |
| Resource Type | Article |
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