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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Hongwei Zeng Huaikou Miao Jing Liu |
| Copyright Year | 2007 |
| Description | Author affiliation: Shanghai Univ., Shanghai (Hongwei Zeng; Huaikou Miao) |
| Abstract | The capability of model checkers to construct counterexamples provides a basis for automated test generation. However, many model checking-based testing approaches just focus on generating test sets with respect to some coverage criteria. Such test sets generally are large and inefficient because of much redundancy. We propose an on-the-fly approach that performs test generation and redundancy elimination by turns. Our approach employs a test-tree to pick out and represent a subset of tests with equal coverage for a test criterion and no redundancy. Along with model checking for a property, a new test sequence is derived from the counterexample and is used to detect redundant properties, and then is winnowed by the test-tree as well. We demonstrate the approach by applying some small examples to our prototyped algorithm. |
| Starting Page | 349 |
| Ending Page | 355 |
| File Size | 283957 |
| Page Count | 7 |
| File Format | |
| ISBN | 9780769528564 |
| DOI | 10.1109/TASE.2007.46 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2007-06-06 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Software testing Automation Costs Automatic testing Laboratories Programming Formal specifications Application software Time factors Software engineering |
| Content Type | Text |
| Resource Type | Article |
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