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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Rajaguru, P. Lu, H. Bailey, C. Ortiz-Gonzalez, J. Alatise, O. |
| Copyright Year | 2015 |
| Description | Author affiliation: Sch. of Eng., Univ. of Warwick, Coventry, UK (Ortiz-Gonzalez, J.; Alatise, O.) || Comput. Mech. Reliability Group, Univ. of Greenwich, London, UK (Rajaguru, P.; Lu, H.; Bailey, C.) |
| Abstract | This paper details a finite element modelling approach of the press pack assembly process for a diode in a power electronic module. Molybdenum and aluminum graphite have been investigated as suitable materials for the contact pad. Contact analysis has been used to model the pressurized thermal interface in order to extract both the stress and temperature distribution in the diode. Average temperature and von Mises stress on the chip for a combination of clamping pressure, load current and contact pad material have been extracted from the modeling results. At present, based on the assumptions and modeling parameters used, Aluminum Graphite seems to have better performance in comparison with molybdenum in terms of generating a lower average chip temperature. Additionally optimum clamping pressure has been estimated by performing a numerical optimisation analysis in order to minimise both the average temperature and stress in the chip. |
| Sponsorship | IEEE |
| Starting Page | 1 |
| Ending Page | 6 |
| File Size | 863299 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781467397056 |
| DOI | 10.1109/THERMINIC.2015.7389607 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2015-09-30 |
| Publisher Place | France |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Presses Contacts Thermal resistance Finite element analysis Clamps Stress Load modeling |
| Content Type | Text |
| Resource Type | Article |
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