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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Zhang Xiuxia Wei Shuyi Lu Bingheng Zhu Changchun Wang Xiaoe |
| Copyright Year | 2009 |
| Description | Author affiliation: Graduate School of the Chinese Academy of Sciences, Beijing 100049 (Wei Shuyi) || Xi'an Jiaotong University, China 710049 (Lu Bingheng; Zhu Changchun) || School of Electronics and Information Engineering, North National University, China 75002 (Zhang Xiuxia; Wang Xiaoe) |
| Abstract | In this paper, the low-cost screen printed method was adopted preparation uniform nano-SiC films on large areas of glass. The reunited nano-SiC was dispersed by ultrasonic before fabricating paste. After fabricating paste, the nano-SiC was further ultrasonic dispersed. The nano-SiC paste was screen printed on glass. Then nano-SiC films was sintered by the furnace controlled artificial intelligence, the anneal test was take to improve the field emission characteristics. The samples of nano-SiC film were micro-analyzed and tested the I-V characteristics. After above experiments and technics, the uniformity and stability of field emission characteristics for nano-SiC film was obtained. |
| Starting Page | 27 |
| Ending Page | 28 |
| File Size | 491645 |
| Page Count | 2 |
| File Format | |
| ISBN | 9781424435876 |
| DOI | 10.1109/IVNC.2009.5271632 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-07-20 |
| Publisher Place | Japan |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Annealing Cathodes Testing Glass Temperature Stability Crystalline materials Semiconductor materials Organic materials Anodes I-V characteristics nano-SiC field emission screen printed mothed |
| Content Type | Text |
| Resource Type | Article |
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