NDLI: Simulation of the influence of secondary electrons on the performance of potential depressed collectors for TWTs

Content Provider	IEEE Xplore Digital Library
Author	Musyoki, S. Takahashi, M. Uchikawa, T.
Copyright Year	2000
Description	Author affiliation: Microwave Tube Div., NEC Corp., Sagamihara, Japan (Musyoki, S.)
Abstract	Significant differences have been found between measured and simulated data for collectors designed with codes which disregard the influence of secondary electrons. To solve this problem, various codes have been developed. These codes assume that secondary electrons are only emitted in a single direction and ignore their spatial distribution. We have developed a code in which secondary electron yield is calculated from an empirical formula and the emitted secondary electrons are assumed to have cosine spatial distribution. To represent this distribution, for each primary beam point of impact, the emitted secondary beam is split into 3 beams; one beam normal to the impact surface and the other two at an angle to the normal. The normal beam carries half of the current and the rest of the current is divided equally between the side beams. The code uses a two dimensional, axis symmetric Finite Element Method (FEM) for modeling. FEM has been chosen because of its ability to model accurately arbitrary shaped structures. We designed a ku-band (14.25 GHz), 2-stage TWT by using the developed code.
File Size	89317
File Format	PDF
ISBN	0780359879
DOI	10.1109/OVE:EC.2000.847511
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2000-05-02
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Computational modeling Electron emission Electron devices Electron tubes National electric code Microwave technology Microwave measurements Computer simulation Finite element methods Microcomputers
Content Type	Text
Resource Type	Article

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