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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Eckerman, P.D. Hendricks, R.W. |
| Copyright Year | 2001 |
| Description | Author affiliation: Dept. of Manage. Sci. & Inf. Technol., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA (Eckerman, P.D.) |
| Abstract | In support of a new 1,800 ft/sup 2/ Class 10,000 cleanroom dedicated to teaching the elements of the microchip fabrication, we are developing a laboratory information management system (LIMS) that provides for the paperless operation of the facility. An essential part of this system is an electronic traveler that accompanies each wafer, tracking all changes and tests performed on it. This traveler replaces a student's lab notes and has the power of automatically recording all processing steps, accurately storing results of all tests performed and being secured against unauthorized access. A custom-built Visual Basic application manages the flow of data from students to the centralized database. Both local and remote access to the wafer data is handled through a standard World Wide Web (WWW) browser. Students are allowed access to data only from wafers that they have been assigned to work on. As an added feature, the Microsoft Office suite of applications has been automated to assist students in the creation of charts and graphs that can be used to prepare lab reports and presentations. |
| Sponsorship | IEEE Electron Devices Soc. |
| Starting Page | 120 |
| Ending Page | 124 |
| File Size | 668094 |
| Page Count | 5 |
| File Format | |
| ISBN | 0780366913 |
| ISSN | 07496877 |
| DOI | 10.1109/UGIM.2001.960310 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2001-06-20 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Fabrication Performance evaluation Education Laboratories Information management Electronic equipment testing System testing Automatic testing Visual BASIC Spatial databases |
| Content Type | Text |
| Resource Type | Article |
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