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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Woodberry, M.E. Hunt, W.D. |
| Copyright Year | 1997 |
| Description | Author affiliation: Microelectron. Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA (Woodberry, M.E.) |
| Abstract | The aging characteristics of a longitudinally coupled SAW resonator on 64/spl deg/ LiNbO/sub 3/ are examined. The aging of these devices was accelerated by applying a high RF power until catastrophic failure occurred. The insertion was measured while the devices were being aged. A LabView program was used to automate equipment control and data acquisition during the experiment. After the devices had been tested, damage to the electrode metalization was observed using both optical and scanning electron microscopy. The observed damage included acoustically-induced metal migration and substrate damage. A device that had not been aged was laser probed to record the distribution of acoustic power across the device. The relation between the distribution of acoustic power and damage to the electrode metalization is discussed. |
| Starting Page | 55 |
| Ending Page | 60 |
| File Size | 287266 |
| Page Count | 6 |
| File Format | |
| ISBN | 0780341538 |
| ISSN | 10510117 |
| DOI | 10.1109/ULTSYM.1997.662979 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1997-10-05 |
| Publisher Place | Canada |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Accelerated aging SAW filters Optical resonators Electrodes Optical microscopy Acoustic devices Surface acoustic waves Radio frequency Acoustic measurements Automatic control |
| Content Type | Text |
| Resource Type | Article |
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