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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Lowhorn, N.D. Wong-Ng, W. Zhang, W. Lu, Z.Q. Otani, M. Thomas, E. Green, M. Tran, T.N. Dilley, N. Elsner, N. Hogan, T. Li, Q. Obara, H. Sharp, J. Venkatasubramanian, R. Willigan, R. Yang, J. Nolas, G. Tritt, T. |
| Copyright Year | 2007 |
| Description | Author affiliation: Nat. Inst. of Stand. & Technol., Gaithersburg, MD (Lowhorn, N.D.; Wong-Ng, W.; Zhang, W.; Lu, Z.Q.; Otani, M.; Thomas, E.; Green, M.) |
| Abstract | The scientific activities of NIST include the development and distribution of standard reference materials (SRMtrade) for instrument calibration and inter-laboratory data comparison. Full characterization of a thermoelectric material requires measurement of the electrical resistivity, thermal conductivity, and Seebeck coefficient. While standard reference materials exist or have existed for the first two properties, Seebeck coefficient standard reference materials are not available. In an effort to expedite research efforts in this field, we have initiated a project to develop a Seebeck coefficient SRMtrade material. Currently, we have completed a round-robin measurement survey of two candidate materials, $Bi_{2}Te_{3}$ and constantan (55% Cu and 45% Ni). In this paper, we summarize our plan and development effort, including the results and the methodology used for the round-robin measurement survey. |
| Starting Page | 361 |
| Ending Page | 365 |
| File Size | 340973 |
| Page Count | 5 |
| File Format | |
| ISBN | 9781424422623 |
| ISSN | 10942734 |
| DOI | 10.1109/ICT.2007.4569495 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2007-06-03 |
| Publisher Place | South Korea |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Conducting materials Thermal conductivity NIST Standards development Instruments Calibration Thermoelectricity Conductivity measurement Electric variables measurement Electric resistance |
| Content Type | Text |
| Resource Type | Article |
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