NDLI: Efficient circuit specific pseudoexhaustive testing with cellular automata

Content Provider	IEEE Xplore Digital Library
Author	Chattopadhyay, S.
Copyright Year	2002
Description	Author affiliation: Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., India (Chattopadhyay, S.)
Abstract	Pseudoexhaustive testing of a combinational circuit involves applying all possible input patterns to all its individual output cones. Since it does not assume any fault model, the testing ensures detection of all static detectable faults in the circuit that do not require two-pattern tests. Earlier works on pseudoexhaustive testing usually generate test sets that are several orders of magnitude larger than the minimum size test set required for a specific circuit, and are mostly based on LFSRs. This paper presents a novel strategy for constructing circuit-specific pseudoexhaustive test pattern generators, based on cellular automata, that result in generating minimal pseudoexhaustive test sets for combinational circuits. Experimentation with ISCAS85 benchmarks show that as compared to the LFSRs, the cellular automata based approach often results in simpler circuitry with lesser number of shift stages and reduced test length. Moreover, the analytical technique developed here is generic in nature and thus can also be applied for constructing LFSR based pseudoexhaustive test pattern generators.
Sponsorship	IEEE Comput. Soc. Test Technol. Tech. Council (TTTC) Tech. Group on Dependable Comput. IEICE Special Interest Group on Syst. LSI Design Methodology IPS Japan
Starting Page	188
Ending Page	193
File Size	1051662
Page Count	6
File Format	PDF
ISBN	0769518257
ISSN	10817735
DOI	10.1109/ATS.2002.1181709
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2002-11-20
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Automatic testing Test pattern generators Combinational circuits Circuit faults Electrical fault detection Fault detection Automatic test pattern generation Benchmark testing Pattern analysis
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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