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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Sabapathi, S.R. |
| Copyright Year | 1998 |
| Description | Author affiliation: Qmax Technol. Pte Ltd., Singapore (Sabapathi, S.R.) |
| Abstract | This paper presents a new and novel technique of employing a Bus Cycle Signature System in cost effective testing and diagnostics of CPU based boards. The system controls the board under test using a single reset line. A CPU specific hardware interface unit generates strobe signals during active bus cycles. During this time, the test nodes are strobed and the resultant bit stream is then compressed into a 16-bit signature word. The fault detection is achieved by comparing bus cycle signatures of the known good board to that of a board under test. The major plus point of the system is its ability to detect faults down to node level with a fault coverage of over 95% in the CPU kernel, without having to write complex time consuming test programs. |
| Starting Page | 165 |
| Ending Page | 171 |
| File Size | 531526 |
| Page Count | 7 |
| File Format | |
| ISBN | 0818682779 |
| ISSN | 10817735 |
| DOI | 10.1109/ATS.1998.741609 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1998-12-02 |
| Publisher Place | Singapore |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | System testing Read only memory Integrated circuit testing Pins Power generation economics Costs Hardware Kernel Automatic testing Read-write memory |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electrical and Electronic Engineering |
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