NDLI: A perturbation based fault modeling and simulation for mixed-signal circuits

Content Provider	IEEE Xplore Digital Library
Author	Ben-Hamida, N. Saab, K. Marche, D. Kaminska, B.
Copyright Year	1997
Description	Author affiliation: OPMAXX Inc., Beaverton, OR., USA (Ben-Hamida, N.)
Abstract	The areas of analog circuit fault simulation and test generation have not witnessed the same degree of success as their digital counterparts. This is due mainly to the complexity of analog behavior and the lack of a fault mode. We present a new functional fault modeling technique called the perturbation fault model. The perturbation fault model is based on an estimation of the distance between the responses of the faulty and fault-free circuit and their distributions. The model allows fault abstraction of physical defects through structural fault modeling and perturbation estimation. The fault simulation technique uses a linear estimation of the faulty and fault-free output circuits. Techniques for fault observation and propagation are presented in order to build a hierarchical analog fault simulator.
Starting Page	182
Ending Page	187
File Size	591648
Page Count	6
File Format	PDF
ISBN	0818682094
ISSN	10817735
DOI	10.1109/ATS.1997.643956
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1997-11-17
Publisher Place	Japan
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit faults Circuit simulation Analog circuits Circuit testing Signal processing Digital circuits Transfer functions Large-scale systems Signal design Fluctuations
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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