NDLI: Cognitive self-adaptive computing and communication systems: Test, control and adaptation

Content Provider	IEEE Xplore Digital Library
Author	Chatterjee, A.
Copyright Year	2009
Description	Author affiliation: Georgia Institute of Technology, 777 Atlantic Drive NW, Atlanta, USA (Chatterjee, A.)
Abstract	CMOS technology scaling along with the resulting large variability of circuit performance has made post-silicon circuit and algorithmic level built-in test and adaptation/tuning almost a necessity for deeply scaled technologies. Currently, circuits are designed to tolerate worst-case process corners. In addition, circuits as well as demodulation/signal processing algorithms must be designed for worst case operating conditions (e.g. environmental noise). This forces designers to excessively guard band their circuits while using “aggressive” back-end algorithms to support the end application, resulting in unacceptable power-performance-yield tradeoffs. One way to tackle this problem is to design circuits and relevant signal processing algorithms that are cognitive of their environmental operating conditions and manufacturing process conditions and use this cognition to perform self-adaptation that conserves power while maximizing yield and reliability. Such self-adaptation involves incorporation of built-in test, diagnosis and tuning/adaptation mechanisms into the circuits and systems concerned. A key issue is that of test, diagnosis and tuning of complex circuit and system-level parameters that must be evaluated and traded off against one another during the adaptation process without access to complex external test instrumentation. This talk summarizes recent results obtained in the design of such cognitive computing and communication systems and points to directions for future work in this area.
Starting Page	2
Ending Page	2
File Size	83333
Page Count	1
File Format	PDF
ISBN	9781424433414
DOI	10.1109/DDECS.2009.5012085
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-04-15
Publisher Place	Czech Republic
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Automatic testing System testing Communication system control Control systems Circuit testing Circuit optimization Signal processing algorithms CMOS technology Algorithm design and analysis Built-in self-test
Content Type	Text
Resource Type	Article

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