NDLI: Atmospheric neutron effects in advanced microelectronics, standards and applications

Content Provider	IEEE Xplore Digital Library
Author	Leray, J.-L. Baggio, J. Ferlet-Cavrois, V. Flament, O.
Copyright Year	2004
Description	Author affiliation: CEA/DIF, France (Leray, J.-L.; Baggio, J.; Ferlet-Cavrois, V.; Flament, O.)
Abstract	Since the 80s it is known that Terrestrial Cosmic Rays, mainly reported as Atmospheric Neutrons, can penetrate the natural shielding of buildings, equipments and circuit package and induce Soft Errors in integrated circuits and Breakdown of power devices. The high-energy neutron fluxes of interest range between 10 particles/cm/sup 2//hour at sea level and 10/sup 4/ particles/cm/sup 2//hour at typical airplanes flight altitude of 30000 feet, with modulation due to Solar Flares. In the 90s the phenomenon has pervaded as a consequence of the roadmap of electronic devices, especially downscaling of design rules, increase of signal bandwidth and increase of the size of DRAM and SRAM memory, standalone or embedded on processors and System-on-Chips. Failure-In-Time and Soft Error Rate became unacceptable. Test Standards and design solutions have been proposed to maintain reliability of commercial products and improve those used in special such as avionic computers. The paper describes the Atmospheric Neutron flux, the effects in the main classes of devices and specific cases such as neutron-induced single event upset observed in CMOS vs. CMOS/SOI and some mitigation issues. A model called CCPM (Critical Cross-Point Model) is proposed to provide critical graphs of technology node sensitivity along the scaling trend of CMOS.
Sponsorship	IEEE Central Texas Sect. Japan Soc. Appl. Phys
Starting Page	311
Ending Page	321
File Size	818976
Page Count	11
File Format	PDF
ISBN	0780385284
DOI	10.1109/ICICDT.2004.1309974
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-05-17
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Neutrons Microelectronics Aerospace electronics Random access memory Atmospheric modeling Semiconductor device modeling Cosmic rays Integrated circuit packaging Packaging machines Electric breakdown
Content Type	Text
Resource Type	Article

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