NDLI: Design and development of detection and analysis system for wheat stripe rust resistance genes

Content Provider	IEEE Xplore Digital Library
Author	Song Qiang Wang Lianzhi Xu Shichang
Copyright Year	2010
Description	Author affiliation: Institute of Plant Protection, Chinese Academy of Agricultural Sciences, Beijing, China (Xu Shichang) \|\| College of Information and Electrical Engineering, China Agricultural University, Beijing, China (Song Qiang; Wang Lianzhi)
Abstract	To improve the efficiency and veracity of the detection and analysis of the wheat stripe rust resistance genes, the detection and analysis system for wheat stripe rust resistance genes (SRGDAS) was designed and developed, through introducing the experience and knowledge of the experts in the agricultural domain into computer. This system is based on the MVC (Model-View-Controller) design pattern, and combined with the component and framework design thought and technology. Taking the detection method and actual analysis process adopted by domain experts into full consideration, developed the knowledge base, the knowledge acquisition facility, the inference engine, the explanation facility, as well as the friendly man-machine interface. This system is principally used to derive the stripe rust resistance genes from the wheat cultivars according to the phenotypes of the tested wheat cultivars infected by Puccinia striiformis. Additionally, it can analyze the existence credibility of the derived known genes in terms of the all-around information of the wheat cultivars. Adopting the clustering method, it can also process the derived unknown genes according to the wheat cultivars resistance characteristics. This system is applied to practice and validated by the detection and analysis experimental data, which verifies the feasibility and validity of this system.
Starting Page	89
Ending Page	94
File Size	688354
Page Count	6
File Format	PDF
ISBN	9781424496730
ISSN	21544824
e-ISBN	9781889335421
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-09-19
Publisher Place	Japan
Access Restriction	Subscribed
Rights Holder	TSI Press
Subject Keyword	Immune system Knowledge based systems Genetics Knowledge engineering Resistance Diseases MVC pattern Wheat stripe (yellow) rust resistance gene gene postulation
Content Type	Text
Resource Type	Article

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