NDLI: On-chip small capacitor mismatches measurement technique using beta-multiplier-biased ring oscillator

Content Provider	IEEE Xplore Digital Library
Author	Sai-Weng Sin He-Gong Wei U-Fat Chio Yan Zhu Seng-Pan, U. Martins, R.P. Maloberti, F.
Copyright Year	2009
Description	Author affiliation: On leave from Instituto Superior Técnico/TU of Lisbon, Portugal (Martins, R.P.) \|\| Analog and Mixed Signal VLSI Laboratory, Faculty of Science and Technology, University of Macau, Macao, China (Sai-Weng Sin; He-Gong Wei; U-Fat Chio; Yan Zhu; Seng-Pan, U.) \|\| University of Pavia, Italy (Maloberti, F.)
Abstract	An on-chip capacitor mismatches measurement technique is proposed. The use of a beta-multiplier-biased ring oscillator improves the measurement sensitivity by over 6 times with respect to the state-of-the art. Experimental results using a 90 nm CMOS and thick-oxide transistors are presented. The method enables the measurement of capacitors with mismatches being as small as σ =0.04% only, and the minimum measurable capacitance can be as small 4.3fF. The results also demonstrated that better matching can be achieved with low-density capacitors.
Starting Page	49
Ending Page	52
File Size	732242
Page Count	4
File Format	PDF
ISBN	9781424444335
DOI	10.1109/ASSCC.2009.5357165
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-11-16
Publisher Place	Taiwan
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Capacitors Measurement techniques Ring oscillators Frequency conversion Inverters Capacitance measurement Switches Filters Noise measurement Voltage beta multiplier and constant gm Capacitor mismatches measurement ring oscillator
Content Type	Text
Resource Type	Article

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